IEEE Transactions on Biomedical Engineering


Information for  Authors - General

The Transactions on Biomedical Engineering accept papers in the following two categories:

  • Regular papers
    Size: 7 fully formatted pages
    Review: Full peer review
    Review time: See review statistics page
  • Letters
    Size: 4 fully formatted pages
    Review: Full expedited peer review, no revisions, Reject or Accept only
    Review time: 2 months from submission to electronic publication

As approved by the EMBS Publications Committee, all submissions of new manuscripts must be in IEEE format. This format is for double column, single spaced text with embedded figures and tables - the format required of final printed copy. The major reasons behind the change are: 1. authors submitting manuscripts that are too long. 2. authors not realizing that their manuscripts will encounter significant page charges. 3. reviewers preferring not to print long documents for review.

Look for "Templates for all Transactions" at this URL:
http://www.ieee.org/publications_standards/publications/authors/authors_journals.html

Also note:
  • 7 pages or fewer: only voluntary page charges ($110/page)
  • 8-10 pages: mandatory page charges ($250/page over 7)
  • >10 pages: requires special permission from Editor in Chief
Manuscript can only be submitted electronically through Manuscript Central (http://mc.manuscriptcentral.com/embs-ieee). 

You should read the Review Process document to get an idea of the steps in the review process.  Please note that the time frame in the Review Process document are goals.  Actual review times and other statistics can be found on the statistics page.

Manuscripts should be submitted according to the Instructions for Authors.  Required forms can be downloaded from the Forms section.

Common questions are answered in our Frequently Asked Questions

For some background on copyright and author responsibility, we recommend the following paper:

Copyrights and author responsibilities
Stone, H.S.
Computer, Vol.25, Iss.12, Dec 1992
Pages:46-51
URL: Download this paper from IEEExplorer